Vibrating sample magnetometer is a good tool to investigate materials’ magnetic properties.
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Al Vs Cu
Traditionally, IC interconnects formed from Al; however due to scaling and performances needs, Copper is gradually replacing Aluminum.
Continue reading “Al Vs Cu”Thermally stimulated current measurement
In semiconductors based devices, defects such as dislocations, grain boundaries, and impurities can function charge traps, which in turn play important roles in determining devices properties
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Electromagnetic shielding effectiveness of EMI materials is commonly measured based on MIL-DTL-83528 or ARP 1705.
Continue reading “EM shielding effectiveness measurements by MIL-DTL-83528”Dielectric Constant Measurement
Dielectric Measurement from www.materean.com
The definition of terms related to dielectric constant can be shown in the following picture.
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