Tumble test and drop test are critical to evaluate a product’s ability to survive the many bumps and scrapes it will experience in its life cycle with an end-user. Tumble test is more random while drop test can control drop orientation, impact point, etc.
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Thermally stimulated current measurement
In semiconductors based devices, defects such as dislocations, grain boundaries, and impurities can function charge traps, which in turn play important roles in determining devices properties
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Dynamic shear is an important parameter to evaluate the cohesive strength of a PSA. It is commonly measured based on the ASTM D1002.
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Electromagnetic shielding effectiveness of EMI materials is commonly measured based on MIL-DTL-83528 or ARP 1705.
Continue reading “EM shielding effectiveness measurements by MIL-DTL-83528”WVTR Measurement-P2O5 Moisture Sensor
For WVTR measurement, moisture sensor is one of the critical components which determine the accuracy of the testing results
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Another standard for the WVTR test is ASTM F1249.
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WVTR testing
ASTM E 96 is a standard for the testing of water transfer rate using cup method, in which two methods is elaborated: Desiccant Method and Water Method. The following content is copied from the linked website.
Continue reading “Water Vapor Transfer Rate Test by cup method”Foam compression set
Compression set is an important parameter to evaluate the foam’s permanent deflection which determines the long term performances,. e.g. sealing, isolation.
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The steady state method is commonly adopted to measure thermal resistance and conductivity of thermal interface materials or TIMs. A heat flow through the TIM is generated and the temperature gradient across the TIM is measured, and the thermal resistance or conductivity can be calculated through the procedure defined by ASTM standard ASTM D5470.
Continue reading “Accuracy of Steady State Thermal conductivity measurement”Cyclic voltammetry
Cyclic voltammeter is frequently adopted to study electron transfer in electrochemistry, battery, electrochromic, semiconducting devices fields.
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